Thesis Topics

VisionLab Will Help You Choose Thesis Topic and Supervision

VisionLab provides students with the supervision of bachelor’s and master’s theses focused on topics related to the measurement of deformations using optical measuring systems based on the digital image correlation technique.


The thesis topics are inspired by contemporary problems solved in engineering practice and the unexplored areas of DIC technique application. Theses are supervised not only by professional lecturers of the institute, but also by industrial specialists and developers.


Thesis topics are not definite and may be adapted according to the students’ research focus or student-submitted topic suggestions.

Bachelor's Thesis Topics

  1. Use of the DIC technique in solving basic problems of solid mechanics
  2. Analysis of the feasibility of using a rolling shutter camera in mechanical testing of materials
  3. Application of the DIC technique in human motion analysis
  4. Use of the DIC technique in biomechanics
  5. Scanning and evaluation of a patient’s hand with Dupuytren’s contracture
  6. Use of mirrorless cameras for deformation analysis utilising DIC
  7. Design of a test rig for biaxial tension loading of small specimens
  8. Developing a computational model of a tensometric grid

Master's Thesis Topics

  1. Measurement of crack length under unidirectional and cyclic loading using the DIC technique
  2. Detection of infill defects in 3D printed structures using the DIC technique
  3. Automation of video extensometers using artificial intelligence
  4. Design of synchronization electronics for measuring periodic events using the DIC technique and artificial intelligence
  5. Use of the DIC technique for measuring residual stresses by the hole drilling method
  6. FEM simulation of deformation measurement using the potential drop technique to identify possible uses in engineering applications
  7. Numerical analysis of measured long-term deformations using the potential drop technique and its basic analytical assumptions to identify limits in resolution and accuracy